Without a map you are nowhere: Explore cells and tissues with BEX imaging

Backscattered Electron and X-ray (BEX) imaging is the combined acquisition of backscattered electron (BSE) and EDS x-ray data in a scanning electron microscope (SEM). BEX provides fast and automated mapping across a large area, simultaneously collecting compositional and ultrastructural data. For BEX, there are no specific requirements for specimen preparation or imaging. Thus, integrating BEX imaging into established EM workflows is effortless. 

This new approach covers a wide range of applications such as localisation of native/endogenous and exogenous elements, nanoparticles, pollution and contaminants, or biomaterials. Imaging large areas of a sample using cartography mode enables rapid identification of regions of interest (ROI). 

In this tutorial, we will show how we characterised a biodegradable bone implants and bone/implant interactions. With BEX cartography mode, the speed of acquisition is increased by 10x when compared to classic EDS and highlights differences not visible with electron contrast alone. 

In addition, as a high speed and sensitive imaging technique, BEX is an excellent method for volume EM (vEM) as it complements array tomography ultrastructural images with chemical information.

Finally, we analysed a lichen sample from London, acting as a bio-remediator for air pollution. The presence of rough surfaces in specimens poses a significant challenge for most energy dispersive spectrometry (EDS) workflows, primarily due to the positioning of the detector. 

Join us and discover:

• What is Backscattered Electron and X-ray (BEX) imaging
• Which applications benefit form BEX
• How BEX can enable the imaging of large areas and samples with rough surfaces

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