Resolve Overlaps & identify trace elements using WDS Scan in AZtecWave

WDS Scan is a new workflow in AZtecWave that enables the positive identification of elements affected by peak overlaps in the EDS spectrum, and/or present in trace concentrations (Less than 0.1 wt%). To identify the element X-ray peaks present in a sample, the Wave spectrometer is scanned over a specified energy range. The output is like that produced by EDS, only due to the fully focusing Rowland circle geometry of the Wave spectrometer, the WDS scan has higher spectral resolution and higher peak to background ratios. This allows X-ray peak overlaps in the EDS spectrum, such as Ti Kβ/V Kα, Cr Kβ/Mn Kα and Mo Lα/S Kα, to be fully resolved, and trace element X-ray peaks to be detected. AZtecWave makes WDS scan setup straightforward, through integration with EDS and a step-by-step workflow. Unique technology automatically calculates the scan collection settings, and a pre-acquisition theoretical scan provides visual feedback to enable settings to be optimised further.

Several different sample types will be presented as examples, including minerals, metals, and solder used in electronics. In addition, the tutorial will include demonstrations of how to; (1) acquire WDS scans using the different setup tools available, (2) identify the element-lines present, and (3) compare multiple WDS scans and EDS spectra.

You will learn how:

• WDS Scan works and what is it for
• To perform a WDS Scan in AZtecWave
• A WDS Scan can be used to inform the setup of a combined EDS-WDS quantitative measurement