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With new technologies comes new capabilities. The new Backscattered Electron and X-ray (BEX) technique is revolutionising elemental analysis in the Scanning Electron Microscope (SEM). Its unique geometry, sensitivity and speed are pushing the boundaries of what’s possible with elemental analysis in the SEM.
During this session, you will see Unity BEX running live on SEM and solving challenging samples and applications for typical Energy Dispersive Spectrometry (EDS) analysis, from analysing fracture surfaces (high topography) and detecting tiny concentration differences in metal and alloys (segregation and diffusion at <1wt%) to multi-scale analysis of whole samples and sub 10nm structure analysis in SEM-STEM mode.
Join us to learn more about BEX and see how the Unity detector is revolutionising analysis in scanning electron microscopy using a variety of sample types to show the power of this new technology in action.
Join us and discover:
Dr. Haithem Mansour graduated with a PhD in Material Science from the University of Lorraine in France. He joined Oxford Instru...