Pushing the Boundaries of Microanalysis in SEM with the BEX Technique

With new technologies comes new capabilities. The new Backscattered Electron and X-ray (BEX) technique is revolutionising elemental analysis in the Scanning Electron Microscope (SEM). Its unique geometry, sensitivity and speed are pushing the boundaries of what’s possible with elemental analysis in the SEM.

During this session, you see Unity BEX running live on SEM and solving challenging samples and applications for typical Energy Dispersive Spectrometry (EDS) analysis, from analysing fracture surfaces (high topography) and detecting tiny concentration differences in metal and alloys (segregation and diffusion at <1wt%) to multi-scale analysis of whole samples and sub 10nm structure analysis in SEM-STEM mode.

Learn more about BEX and how the Unity detector is revolutionising analysis in scanning electron microscopy using a variety of sample types to show the power of this new technology in action.

You will learn:

Basics of the BEX technique and its advantages
How BEX is used to increase productivity in SEM and solve real challenging applications
How tiny level of segregation can be detected in steel (<1wt%)
How sub 10nm X-ray spatial resolution can be achieved in SEM with BEX