Moiré Characterization of Twisted 2D Materials by AFM

Designed to probe surfaces at the nanoscale in ambient conditions, AFM is a near-perfect tool for providing quick characterization of moiré superlattices in van der Waals heterostructures, such as twisted bilayer graphene. Moiré has been observed with a variety of AFM modalities, including piezoresponse force microscopy (PFM), lateral force microscopy (LFM), conductive AFM, kelvin probe force microscopy (KPFM), torsional force microscopy (TFM), and contact mode. This webinar looks at examples of moiré imaging from a variety of AFM techniques, discuss the relative benefits and tradeoffs of each of these, and provide some practical imaging advice. Additionally, whether the moiré pattern is straightforward and easy to observe depends not only on the imaging technique and settings used, but also on the AFM itself. With moiré contrast stemming mostly from relatively small signals, the lower the AFM’s noise floor and susceptibility to environmental noise, the easier the moiré will be to image. High performance AFMs make moiré imaging into an easy and routine measurement.

You will discover:

•  Overview of AFM modes that are typically used to study twisted 2D materials
•  The advantages and disadvantages of these modes for imaging moiré

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