A technique that has yet to be widely adopted across the microscopy community, we feel that STEM-SEM provides a strong alternative to traditional TEM and STEM. It has shown to be extremely effective when analysing features with sizes between 3 and 100 nm, whilst requiring significantly less column alignment and faster turn around when imaging a range of samples.
In this tutorial, discover the fundamentals of Energy Dispersive Spectrometry (EDS) analysis within a Transmission Electron Microscope (TEM), exploring the differences between a TEM and scanning electron microscopy.
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On Demand
Duration:1 Hour
Language:English
Businesses:NanoAnalysis
Dr Sam Marks graduated with an MPhys in Physics from the University of York, and a PhD in electron microscopy from the Universi...
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