Improve TKD analysis by an order of magnitude

Transmission Kikuchi Diffraction (TKD) is an Electron Backscatter Diffraction technique that is capable of characterising phase and orientation information for nano-structured materials. Keller and Geiss obtained the first data over a decade ago. Since then, the technique has evolved and become commonly used as a solution for improving spatial resolution when the limits of conventional EBSD are reached.

TKD analysis is done using an electron transparent sample, and the diffraction signal is generated from the lower side of the sample, resulting in a different setup compared to conventional EBSD. The early TKD work was done using conventional EBSD hardware and software, which required improvements of band detection and indexing routines to deal with distortions and broader bands in the diffraction pattern.

In this tutorial, we explain how TKD analysis can be improved using the Near Axis TKD (NA-TKD) solution, which introduces a new geometry and new detector hardware. We also cover the differences compared to conventional TKD, the benefits added by this solution and how it can extend the capabilities of your CMOS EBSD system.

Join us and discover:

• Near Axis TKD, what is it?
• How this solution can benefit your applications
• Practicalities of changing screen, when going between setup for EBSD analysis and NA-TKD