QUANTUM TECHNOLOGY

Fabrication and Characterisation of Quantum Devices

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The performance of even the simplest element of quantum computers is dramatically impacted by subtle details of device fabrication. How can you solve the critical challenges in device fabrication for quantum devices?

Oxford Instruments, Raith, delmic and Qnami team up to share comprehensive knowledge about the fabrication and characterization of quantum devices in a joint symposium.

Working closely with the quantum community enable us to understand and solve the fabrication challenges for quantum devices. In this joint symposium, we give an overview of how to minimize losses arising from device processing as well as how to control the size of the nanomaterial with nanometre resolution. Check the Agenda below for more details.

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On Demand
Time:

On Demand

Duration:

4 hours 10 minutes

Language:

English

Businesses:

Plasma Technology

In Partnership With

Time (CET)

Talk Title

Presenter

9:30-9:40

Welcome and introduction

Jörg Stodolka, Raith GmbH

9:40-10:10

Supporting the development of quantum devices with Scanning NV Magnetometry

Dr Joerg Lenz, Qnami

10:10-10:40

Correlative Metrology for Emerging Nanoelectronics with Scanning Nitrogen-Vacancy Magnetometry

Dr Umberto Celano, Imec

10:40-11:10

Nanofabrication for quantum computing

Michael Kahl, Raith GmbH

11:10-11:40

Quantum optics on a chip

Menno Poot, TU München

11:40-12:40

Lunch Break

12:40-13:10

Cathodoluminescence microscopy for nanoscale optical inspection

Toon Coenen, Delmic

13:10-13:40

Investigating exciton-plasmon-photon interactions by cathodoluminescence spectroscopy

Dr Nahid Talebi, Kiel University

13:40-14:40

Superconducting Qubits: Fab to Fridge

Dr Russ Renzas, Oxford Instruments Plasma Technology

14:40-15:30

Q&A Session

Speakers


 

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