SustainabilityInvestorsCareers News Contact
Investors Careers
Home
Applications
Advanced ManufacturingAgriculture & FoodAstronomyAutomotive & AerospaceBio Imaging & Life Science
Chemical & CatalysisEnergy Generation & StorageForensics & EnvironmentGeology, Petrology & MiningMetals, Alloys, Composites & Ceramics
PharmaPhotonicsPolymersQuantum TechnologiesSemiconductors, Microelectronics & Data Storage
Products
ATOMIC FORCE MICROSCOPYELECTRON MICROSCOPYBEX EBSDEDSLight MicroscopyWidefield MicroscopesConfocal MicroscopesSuper Resolution Microscopes3D/4D Visualization SoftwareNanoindentation
Modular Optical SpectroscopyNuclear Magnetic ResonanceRaman MicroscopyConfocal Raman MicroscopesRaman-SEM MicroscopesRaman-AFM-SNOM MicroscopesRaman-based Particle AnalysisScientific Imaging Cameras
DEPOSITION TOOLSPlasma Enhanced Chemical Vapour Deposition (PECVD)Inductively Coupled Plasma Chemical Vapour Deposition (ICPCVD)Atomic Layer Deposition (ALD)Ion Beam Deposition (IBD)ETCH TOOLSInductively Coupled Plasma Etching (ICP RIE)Reactive Ion Etching (RIE)Deep Silicon Etching (DSiE)Atomic Layer Etching (ALE)Ion Beam Etching (IBE)
LOW TEMPERATURE SYSTEMSDilution RefrigeratorsHigh Field MagnetsCryostatsX-RayX-Ray SourcesX-Ray Cameras
Learning
Learning CentreWebinarsEvents
Services
Contracts & AgreementsSparesUpgrades
TrainingApplication & Product SupportLiveAssist
Shop
UKEuropeUS & CanadaAsiaJapanChina
Contact
eCommerce
  1. Learning Centre
  2. Asset

HeLa Cells

TIRF data overlaid on rendered AFM topography of HeLa Cells, 40 ?m scan. Image courtesy of M. Kellermayer, University of Pécs.

Date: 16th November 17

Last Updated: February 20, 2019, 5:23 pm

Author: Asylum Research

Category: Asylum Gallery Image

Share

© Oxford Instruments 2024

Website by Miramar Communications Ltd