We look forward to the Seeing is Believing: What can you see with the latest materials characterization and imaging tools? Workshop in the Boston area at the Silklab, Tufts University on October 17-18, 2024.

The Workshop takes place at 200 Boston Ave, Medford, MA 02155.

About the workshop:

Raman Imaging and Scanning Electron (RISE) microscopes equipped with EDS detectors integrate ultrahigh structural resolution, exceptional chemical sensitivity, and atomic precision to provide seamless, comprehensive materials characterization.

Correlating Raman, SEM, and EDS data from the same measurement position helps researchers obtain greater insight regarding the relationship between a sample’s surface properties and its molecular and atomic composition. Combining these three methods in one instrument with a common vacuum chamber enhances user-friendliness, accelerates experimental workflow, and increases sample turnover. 

Speakers from Oxford Instruments will present the latest advancements in instrumentation that can impact these fields;

• Correlative imaging based on confocal spectroscopic systems: from Raman and fluorescence imaging to non-linear SHG and time resolved spectroscopic imaging techniques 
• Atomic force microscopy (AFM): video-rate imaging (biomolecular dynamic) with Quadrature Phase Differential Interferometry (QPDI), video-rate speed imaging, and blueDrive photothermal excitation., high resolution imaging (moiré on 2D materials), interferometric detection (accurate and precise PFM on ferroelectrics).
• EM detectors: EDS, EBSD, WDS, BEX, NanoIndentors, updates to cutting edge technologies

You will also hear invited guest speakers describe cutting-edge research utilizing these advanced tools.

We invite researchers interested in characterizing and imaging their materials at the highest spatial, temporal, and spectral resolutions to come and participate!

Speakers and Program:

October 17, 2024

10:30 – 11:00 a.m. Registration

11:00 – 11:05 a.m. Opening Remarks Aleks Krsmanovic (Oxford Instruments)

11:05 – 11:50 a.m. Dr. Ute Schmidt (Oxford Instruments) | RISE Microscopy: The Benefits of Correlative Scanning Electron and Confocal Raman Microscopy

11:50 a.m. – 12:30 p.m. Ted Limpoco Ph.D. (Oxford Instruments)
Title: Can AFMs be more accurate and precise? New interferometric detection system for tip displacement sensing

12:30 – 1:15 p.m. Lunch Break

1:15 – 2:00 p.m. Prof. Giulia Guidetti (Silklab, Tufts University)

2:00 – 2:05 p.m. Closing Remarks Aleks Krsmanovic (Oxford Instruments)

2:05 – 5:00p.m. Hands-on Demos (45 minutes each)

*Silklab tours are available in the afternoon

October 18, 2024

8:30 – 9:00 a.m. Coffee and Registration

9:00 a.m. – 12:00 p.m. Hands-on Demos (1 hour each)