Join us for our upcoming workshop, Both Form and Function: Raman-SEM and EDS for Structural and Compositional Analysis. Hosted by Oxford Instruments and Colorado School of Mines Shared Instrument Facility on October 23, 2024.

The workshop will be held at 1523 Illinois St., Golden, CO 80401

CoorsTek Center for Applied Science & Engineering Building.

About the workshop:

Raman Imaging and Scanning Electron (RISE) microscopes equipped with EDS detectors integrate ultrahigh structural resolution, exceptional chemical sensitivity, and atomic precision to provide seamless, comprehensive materials characterization.

Correlating Raman, SEM, and EDS data from the same measurement position helps researchers obtain greater insight regarding the relationship between a sample’s surface properties and its molecular and atomic composition. Combining these three methods in one instrument with a common vacuum chamber enhances user-friendliness, accelerates experimental workflow, and increases sample turnover.

This workshop will be of interest to materials scientists, physicists, chemists, and any researchers looking to investigate both the form and function of sample components.

It will feature:

• An introduction to the theoretical background and hardware considerations related to RISE microscopes
• A description of available technique variations, including 3D Raman imaging, particle analysis, and energy-dispersive X-ray spectroscopy (EDS)
• Application examples from fields including material sciences, semiconductors, energy storage, ceramics, and geo

Speakers and Program:

9:00 – 9:15 a.m. Opening Remarks

9:15 – 10:00 a.m. Dr. Ute Schmidt (Oxford Instruments) | RISE Microscopy: The Benefits of Correlative Scanning Electron and Confocal Raman Microscopy

10:00 – 10:45 a.m. Amanda Bellafatto, Ph.D. (Colorado School of Mines) | 3D Raman Spectroscopy Stress Field Mapping of Indentation Fracture, a volumetric approach

10:45 – 11:00 a.m. Coffee Break

11:00 a.m. – 12:00 p.m. Dr. Sonika Robertson (Oxford Instruments) | High spatial resolution EDS mapping and EBSD/TKD analysis in Scanning Electron Microscopes​

12:00 – 1:00 p.m. Lunch break

1:00 – 3:00 p.m. Hands-on Demo Sessions

3:00 p.m. Closing Remarks