Metrology Symposium 2019
Hosted by Stanford University
November 6 – 7, 2019

Join Oxford Instruments and technical experts from Research at the 2019 Metrology Symposium hosted by Stanford University. Demonstrations and presentations on the use of the latest, state-of-the-art instrumentation will be covered - specifically in context of metrology and quality control as it applies to device and material fabrication

The Symposium will take place on Wednesday and Thursday (November 6-7) on the Stanford Campus. The morning lectures will take place in the Paul G. Allen Annex Auditorium (Paul Allen Building, Room 101X). The afternoon demonstrations will be hosted in Allen Annex building as well as Spilker 007 (Raman).