We are excited to sponsor and be part of M&M 2024 at the Huntington Convention Center in Cleveland, Ohio, July 28 – August 1, 2024.
At last year's event, we proudly introduced Unity, the world’s first BEX imaging detector, which received an overwhelming response. Unity revolutionizes the field of scanning electron microscopy by combining Backscattered Electron and X-ray imaging techniques into a single, streamlined workflow. This groundbreaking technology has accelerated discovery and simplified workflows for researchers worldwide.
In 2023, we introduced the alpha300 Semiconductor Edition, designed specifically for Raman imaging of up to 300 mm wafers. This innovation was made possible by the modular design of our instrument and our commitment to meeting the evolving needs of the R&D community.
FemtoTools, a developer of high-speed, high-precision nanoindentation instruments, is now part of Oxford Instruments! We offer both in-situ SEM Nanoindenters and standalone systems which are highly complementary to our Electron Microscopy analytical techniques, such as EDS and EBSD. These products lead the way in Mechanical Microscopy, the imaging of mechanical properties across a sample through rapid sequential nanoindentation
During this year's event, we will showcase these cutting-edge technologies along with other conventional electron microscope analytics. We will also announce exciting developments currently in the pipeline and offer live demonstrations of our latest innovations.
We look forward to welcoming you at Booth #410 in Cleveland.
Not only do we have a lot that is new to talk to you about, but our team of experts will also be participating in many activities during the event. As well as hosting several symposia and presenting a number of papers, we are offering two vendor tutorials, two Lunch and Learn events and a full schedule of State-of-the-Art sessions. Discover more of what we have planned for this year at M&M 2024, here, including booking a demo.
Location
Huntington Convention Center, Cleveland, Ohio
Date
July 28 - August 1, 2024
Businesses
NanoAnalysis, WITec | Raman
Unity - the World’s first BEX imaging detector – was launched at M&M 2023. It works by combining Backscattered Electron and X-ray imaging into a single technique – BEX. Unity makes it easier than ever before to image and analyze an entire sample in minutes, due to the high-speed of BEX data collection, and can boost microscope productivity by up to 100x. Fundamental to the speed and power of Unity is its unique design. It combines two types of sensors within one detector head and sits under the microscope pole-piece. The game-changing Unity detector combines the topographic, crystallographic, atomic number and elemental information into an instant high-resolution visual output. So, users can effortlessly navigate around the sample, and sophisticated analysis can be simpler and faster than ever.
The FT-NMT04 Nanomechanical Testing System is a versatile in-situ SEM/FIB nanoindenter capable of accurately quantifying the mechanical behavior of materials at the micro- and nanoscale. As the world’s first MEMS-based in-situ SEM nanoindenter, this system features unmatched resolution, repeatability, and dynamic range.
RISE Microscopy is a novel correlative technique that integrates Raman Imaging and SEM within one instrument featuring a common vacuum chamber. Automated shuttling between measurement positions enables the fast, convenient overlay of chemical characterization and structural surface properties at the highest resolution. EDS, EBSD, and BEX detectors from Oxford Instruments NanoAnalysis can further enhance these systems’ capabilities.
The alpha300 series is a versatile, modular line of confocal Raman imaging and correlative microscopes that can be configured for individual requirements and evolve along with experiments. Variations include Raman-AFM/SNOM, Raman-SEM, inverted Raman microscopy, mobile research-grade Raman microspectroscopy, and systems featuring ParticleScout Raman-based microparticle analysis.
We are hosting a extensive program of on-booth sessions at M&M 2024.
Please join us for one of our vendor tutorials. These are designed to let you get a flavor of the analytical power of the of our technology, first hand, as we walk you through some of the key capabilities in each hour long form.
| Session | Date | Time | Presenter | Presentation Title |
| Vendor Tutorial | Monday, July 29 | 5:45 pm | Haithem Mansour | Unity: making imaging elementary |
| Vendor Tutorial | Tuesday, July 30 | 5:45 pm | Ute Schmidt & Joshua Lea | Combining confocal Raman with ultrastructural SEM imaging: A practical approach to RISE microscopy |
Each presentation in our State-of-the-Art series will focus on one or two aspects of a given SEM analytical technology or technique to discuss some of most exciting associated developments with it. These will be held during the scheduled coffee breaks on each day, lasting around 15 minutes. Please join us to learn about some of the hottest new developments in SEM analytics.
| Date | Time | Presenter | Topic | |
| Monday, July 29 | 3:15 PM | Kim Larsen | The advantage of NA-TKD with Symmetry S3 | |
| Tuesday, July 30 | 10:15 AM | Kim Larsen | AZtecCrystal Particle Analysis | |
| Tuesday, July 30 | 3:15 PM | Haithem Mansour | How the new BEX technique is changing the way we use SEM | |
| Wednesday, July 31 | 10:15 AM | Pedro Machado | Correlate and analyse multimodal microscopy with Relate | |
| Wednesday, July 31 | 3:15 PM | Sandy Larios | Remote & real-time lab management with Oi View | |
| Thursday, August 1 | 10:15 AM | Josh Lea | From composition to chemistry: BEX & Raman in the SEM |
Each Lunch & Learn session is being held between 12 and 1pm in Salons F, G, H at the Cleveland Marriott Downtown at Key Tower hotel, next to the conference center. A boxed is lunch is included. Spaces are limited and will be allocated on a first-come-first served, basis.
| Date | Time | Presenter | Presentation Title |
| Monday, July 29 | 12:00 pm | Simon Burgess | Cutting edge EDS technology – what’s the difference? |
| Tuesday, July 30 | 12:00 pm | Ute Schmidt & Joshua Lea | RISE Microscopy: The Benefits of Correlative Scanning Electron and Confocal Raman Microscopy |
What is cutting edge in EDS technology today? The capabilities of EDS hardware and software have changed so much since I first sat in front of a SEM 30 years ago. Starting with the output from an X-ray detector, we will look into this difference from a number of perspectives, to demonstrate the how and why we can achieve so much more sensitivity, accuracy and speed. We will also provide insights on how we can overcome specific challenges for nano- and micro-analysis and the newly emerging area of SEM based X-ray imaging and BEX (backscatter and X-ray imaging). This is an educational session, we hope will be thought provoking, rather than cause indigestion, aimed at linking theory to capability to help us understand where the boundaries of X-ray analysis may now lie.
Key learning objectives:
Correlating Raman, SEM and EDS data from the same measurement position helps researchers obtain greater insight regarding the relationship between a sample’s surface properties and its molecular and atomic composition. Combining these three methods in one instrument with a common vacuum chamber enhances user-friendliness, accelerates experimental workflow, and increases sample turnover. This seminar will be of interest to materials scientists, physicists, chemists, biologists and any researchers looking to investigate both the form and function of sample components.
Key learning objectives:
We were excited meet you face to face at M&M, this year. If you're interested in BEX or the latest in Raman microscopy, EDS, WDS, EBSD, AFM or NanoManipulation, or would like to see the benchtop Confocal Microscope which delivers amazing images at the push of a button, please request a demo. We’d be delighted to show you how our solutions can help achieve great results.
Can't make it in person? We'd be delighted to set up a virtual demonstration for you.
Please fill out the form below to book your demo.
Our team of experts play an active role in this event, participating in a number of symposia and presenting papers, all revealing something that's new in EM Analytics or materials characterization. You can see the full details of our participation in M&M 2024, below.
If you would like a personal demonstration, simply request one by completing the form.
| Session | Date | Time | Presenter | Presentation Title |
| B06.1 | Wednesday, July 31 | 9 am | Anthony Hyde | The installation and operation of SEM-EDS analysis in a regulated environment |
| A10.7 | Wednesday, July 31 | 2 pm | James Sagar | A correlative look at a battery cathode |
| A10.7 | Wednesday, July 31 | 2:30 - 2:45 pm | Markus Boese | Correlative EDS and Raman spectroscopy (Data acquired in collaboration with U. Schmidt, T. Meyer, et al.) |
| A07.P1 | Wednesday, July 31 | 3 pm | Phillip Pinard | Characterization and customization of individual EDS detectors to improve X-ray microanalysis |
| A11.P1 | Thursday, August 1 | 10 am | Kim Larsen | Improving transmission Kikuchi diffraction workflows |
| A10.9 | Thursday, August 1 | 1:30 - 1:45 pm | Ute Schmidt | Characterization of dislocations in GaN wafers using correlative microscopy: A Raman-SEM-EDS and AFM study |
| A05.2 | Thursday, August 1 | 4 pm | Lucia Spasevsky | State of the art SEM-based, electron, X-ray and Raman imaging and analysis reveals century old secrets: Case of a 19th century wooden inventory |
| C05.4 | Thursday, August 1 | 4:30 pm | Pedro Machado | Correlative Raman, backscattered electron and X-ray imaging and energy dispersive x-ray spectrometry uncovers unique chemical signatures surrounding nanoparticles and wear debris in periprosthetic tissue. |
© Oxford Instruments 2024