Event

Microscopy & Microanalysis 2023

Jul
27

M&M 2023

Meet Oxford Instruments at M&M 2023

We are excited at M&M2023 at the Minneapolis Convention Center, Minneapolis, Minnesota, from July 24th to 27th, 2023! 

We will be demonstrating Unity - the world’s first BEX imaging detector that combines Backscattered Electron and X-ray (BEX) imaging in a single technique, simultaneously. We will also have the latest in traditional Electron Microscope analytics and fluorescent microscopy on display, alongside Oxford Instruments’ broader Materials Analysis and Life Science capabilities, with live demonstrations available.

The BC43 Andor Benchtop Confocal Microscope, which delivers amazing images at the push of a button, will also be on show. WITec Raman imaging and correlative Raman-SEM (RISE) solutions, which redefine the state-of-the-art in speed, sensitivity and resolution along with Suite SIX, the newest version of WITec’s integrated software environment for instrument control and data analysis. As is our Cypher AFM, which routinely achieves higher resolution than other AFMs and is available with a full range of operating modes, environmental controls, and even video-rate scanning.

We look forward to seeing you on booth 620.

Location

Minneapolis, MN, USA

Date

July 23 - July 27, 2023

Businesses

NanoAnalysis, WITec | Raman, Andor, Asylum Research

M&M 2023

M&M Activities 

Our team of experts participated in a number of symposia and presenting a paper, all relating to what's new in EM Analytics and materials characterization. You can see the full details of our participation in M&M 2023, below.

If you would like a personal demonstration, simply request one by completing the form.

M&M 2023 event

Symposium presentations


SessionDateTime*PresenterPresentation Title
A02.1Mon, July 2414:15 - 14:30Phillipe PinardUse of spectrum simulation to acquire reliable scans with a wavelength dispersive spectrometer
B09.1Mon, July 2414:15 - 14:30Louise HughesElemental Maps to Dye for: Energy Dispersive X-ray Spectrometry Facilitates a Better Understanding of the Contrast Mechanisms in Common Electron Microscopy Stains
C05.3Tues, July 2513:45 - 14:00Haithem MansourHigh Temperature EDS and EBSD Analysis - Enabling in-situ Heating for Direct Observation of Phase Transformations in the SEM
A14Wed, July 2611:45 - 12:00Pat TrimbyEffective Characterization of Dental Enamel Nanostructures Using Pattern Matching: A Combined TEM and SEM-TKD Study
B10.1Thurs, July 2709:15 - 09:30Louise HughesMulti-modal and correlative microscopy reveals significant changes in composition, structure and biomechanical properties in dentine and enamel exposed to common acid solutions.
C03.7Thurs, July 2714:45 - 15:00Josh LeaMultimodal Analysis of Concrete and Cementitious Materials
C03.7Thurs, July 2713:30 - 13:45Ute SchmidtCorrelative Microscopy Applied to Battery Research
A09.3Thurs, July 2716:00 - 16:30Ryan Wagner (Purdue University)Quantifying Electromechanics in Emerging Functional Materials: Electrostatics, Blind Spots and Precision

Posters Presentations

SessionDateTime*PresenterPresentation Title
A08.P1Mon, July 2415:00 - 17:00Dan HaspelGetting The Best Spatial Resolution By Using Low kV EDS in FIB Workflows
A14.P1Mon, July 2415:00 - 17:00Pat TrimbyCoupling Quantitative Microstructural Measurements to Mechanical Properties Using Correlative Mechanical Microscopy

Discover our Latest Products

As you would expect, we  plenty of exciting new developments on show from Oxford Instrument at M&M 2023. 

Read on to learn more...


Unity

Unity is the World’s first BEX imaging detector. It works by combining Backscattered Electron and X-ray imaging into a single technique – BEX. Unity is making it easier than ever before to image and analyse an entire sample in minutes, due to the high-speed of BEX data collection, and is boosting microscope productivity by up to 100x. Fundamental to the speed and power of Unity is its unique design. It combines two types of sensor within one detector head and sits under the microscope pole-piece. The game-changing Unity detector combines the topographic, crystallographic, atomic number and elemental information ​into an instant high-resolution visual output. So, users can effortlessly navigate around the sample, and sophisticated analysis can be simpler and faster than ever.

AZtecCrystal 3.0

 AZtecLive 6.1 is the latest release of this marketing-leading software platform, bringing with it some significant advances. The new AZtecMatch functionality enables AZtec EDS users to identify features or samples automatically in the electron microscope. With AZtecWave, elemental maps can now be acquired simultaneously using EDS and WDS, enhancing the speed of EDS analysis with the sensitivity of WDS and ensuring accurate mapping results for trace elements or elements affected by X-ray peak overlaps. For those working with EBSD, the new “Optimize Experiment” step in AZtecHKL simplifies the EBSD data collection process by guiding users through every stage of an EBSD measurement, ensuring maximum analysis speeds and optimum data quality, whatever the application

Find out more

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Lunch & Learn 

Oxford Instruments likes to bring you food for thought, and in that vein, we are hosting two lunchtime events in order to share on exciting news in the world of SEM analysis.

  • We have revolutionised imaging by combining Backscatter Electron & X-ray (BEX) in a single technique to make sophisticated analysis simpler and faster than ever
  • Learn how AZtecCrystal MapSweeper harnesses new EBSD pattern matching technologies to deliver enhanced materials characterization

Both lunch & Learn sessions are being held between 12 and 1pm in the Mirage Room at the Hyatt Regency Minneapolis hotel, next to the conference centre. A plates is lunch is included. Spaces are limited and will be allocated on a first-come-first served, basis.

DateTimeSpeakerTitle
Tues July 2512:00 pmDr Pat TrimbyWhat’s in a pattern? How AZtecCrystal MapSweeper extracts more information from your samples using smart EBSD pattern matching methods.
Wed July 2612:00 pmDr Haithem MansourIntroducing Unity: The World’s First Backscatter Electron & X-Ray (BEX) Imaging Detector for Scanning Electron Microscopy
Register for Dr Pat Trimby's talk on AZtecCrystal Register for Dr Haithem Mansour's talk on Unity & BEX


Read more by Pat Trimby, here.

Read more by Haithem Mansour, here.

Request a demo

We were excited meet you face to face at M&M, this year. If you're interested in BEX or the latest in Raman microscopy, EDS, WDS, EBSD, AFM or NanoManipulation, or would like to see the benchtop Confocal Microscope which delivers amazing images at the push of a button, please request a demo. We’d be delighted to show you how our solutions can help achieve great results. 

Can't make it in person? We'd be delighted to set up a virtual demonstration for you.

Please fill out the form below to book your demo.