The 31st edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2024) is coming to Marina Bay Sands, Singapore. This symposium remains dedicated to fostering collaboration and knowledge exchange among the brightest minds in the exploration of physical and failure analysis of integrated circuits.
Visit us at Booth # A4 to meet Oxford Instruments' scientific experts and see a live demonstration of our Cypher AFM system! This is an excellent opportunity to witness the capabilities of our cutting-edge technology in action. For more information about how our solutions can assist in manufacturing and characterizing devices with atomic precision, identifying and understanding failure modes, and monitoring advanced manufacturing processes, please visit our application page.
To schedule a meeting with our OI experts, please complete the form to book your preferred time. We look forward to connecting with you and discussing how our solutions can help achieve your objectives. A surprise gift will be given onsite once we receive your meeting request at the exhibition!
One day prior to the official conference, we will participate in the Technology Showcase and Workshop on July 15th from 17:45 to 19:30 at the Marina Bay Sands Expo and Convention Centre. This showcase offers free admission, with registration required. For more information and to register, please visit the technology showcase page.
During the conference, Dr. Jiang Wu will be delivering a talk on the subject below. For further information, visit the IPFA technical program page.
We look forward to seeing you at IPFA 2024!
Location
Orchid Main Ballroom, Marina Bay Sands Expo and Convention Centre, Singapore
Booth Number
A4
Date
15 - 18 July 2024
Businesses
Asylum Research, NanoAnalysis, WITec | Raman
Topic: EBSD Method for Measuring Wafer Off-Cut
Date: July 18, third presentation slot, 8:50AM to 10:40AM
Location: Breakout Room A, Marina Bay Sands Expo and Convention Centre
Dr. Wu Jiang is our highly experienced Senior Application Scientist with more than ten years of experience in providing technical support for microanalysis products such as EDS, EBSD and WDS in Asia. He has led several key projects, such as implementing high-resolution EDS-EBSD solutions to semiconductor interconnectors. Dr. Jiang holds a doctoral degree in Materials Physics and Chemistry from Dalian University of Technology in China, and a co-joint doctoral degree in Materials Science from Metz University in France. Prior to joining Oxford Instruments, Dr. Jiang was a post-doctoral fellow at Metz University and an application scientist at EDAX in Shanghai. He has extensive experience in microanalysis and is highly proficient in several analytical techniques.
© Oxford Instruments 2024