Work alongside Asylum Research applications scientists in a hands-on introductory Atomic Force Microscopy (AFM) course. This two-day class is aimed at those who are new to AFM or who would like to sharpen their fundamental AFM skills. Through a combination of lectures and hands-on experiments students will learn how to perform basic imaging measurements using the latest Asylum Research AFMs.
Course material will include topographic imaging using contact and tapping modes, probe selection, and basic image modification and analysis. Additionally, the course will survey nanomechanical and nanoelectrical measurements. Students will receive a certificate of completion at the end of the course.
Who Should attend?
Academic researchers and industrial users who are either new to AFM or looking to strengthen fundamental AFM skills.
Pricing
$2,300 per attendee for the two-day course. An optional third day of individualized 1:1 training can be included for an additional $1,950.
Course is limited to a maximum of 8 registrants.
Optional 1:1 training add-on is subject to limited availability.
Register NowLocation Santa Barbara, California, USA |
Date September 17–18, 2024 |
Business |
Asylum Research |
Travel and Lodging |
For directions and hotel information click here. |
Questions? Contact AFM.Support@oxinst.com |
Testimonials from Past Courses
"Great class. Loved the balance between lecture and hands on time."
"Good balance of information and practical applications....This [class] has been fantastic and incredibly helpful. Everyone from Oxford and Asylum were amazing!!! Thank you!"
"Keith J. was very knowledgeable about the science of AFM. He did an awesome job with conveying the information and keeping the attention of the class."
About the Instructor
Keith Jones has 25+ years of experience in SPM, specializing in nanoelectrical characterization. He was instrumental in developing and applying electrical AFM techniques, such as dopant profiling and scanning microwave impedance microscopy. Keith is also a co-inventor on a patent for scanning impedance microscopy and has co-authored 40+ published papers.
Course Schedule
Day 1
Day 2
Day 3 (Optional Add-On)
Equipment
The course will use the following Asylum AFMs:
Payment
Registrants may choose to pay with credit card or purchase order. Please indicate your preference on the registration form and we will follow up with further details.
Questions
For questions related to this course please contact AFM.Support@oxinst.com.
Course and Travel Information
Attendees are responsible for all travel, hotel, and meal costs, except lunch, which will be included daily and one group dinner on the first night. Your seat for the course will be confirmed after the registration deadline (August 23, 2024). The minimum number of participants is 6, if there are fewer, then the course will be cancelled and any paid registrants will have the option to register in a future course or be fully refunded. Attendees are therefore advised to avoid making non-refundable travel arrangements before the course is confirmed.
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