Introduction to Atomic Force Microscopy

AFM Fundamentals Training Course

Work alongside Asylum Research applications scientists in a hands-on introductory Atomic Force Microscopy (AFM) course. This two-day class is aimed at those who are new to AFM or who would like to sharpen their fundamental AFM skills. Through a combination of lectures and hands-on experiments students will learn how to perform basic imaging measurements using the latest Asylum Research AFMs.

Course material will include topographic imaging using contact and tapping modes, probe selection, and basic image modification and analysis. Additionally, the course will survey nanomechanical and nanoelectrical measurements. Students will receive a certificate of completion at the end of the course.

Who Should attend?

Academic researchers and Industrial users who are either new to AFM or looking to strengthen fundamental AFM skills.

Pricing

$2,250 per attendee for the two-day course. An optional third day of individualized 1:1 training can be included for an additional $1,900.

Course is limited to a maximum of 6 registrants.

Optional 1:1 training is subject to limited availability.

Where?

Join us in our new state-of-the art facilities in beautiful Santa Barbara, CA. In 2021 we upgraded, moving just down the road from our old location.

Course Schedule 

Day 1

• • Understanding the principles and operation of AFM for topographic imaging, including contact and tapping modes
  • Optimization of image quality, and identification and elimination of artifacts
  • Probe selection and tips

Day 2

• • Basic image modification and use of image analysis tools
  • Survey and explanation of the full capabilities of AFM including nanomechanical and nanoelectrical measurements

Day 3 (Optional)

• • Image a sample from your own lab or receive individualized advanced training about a topic of your choosing!