Nov
19

Introducing Unity: Transform Your Analytical Capabilities in Wixom, MI

We are excited to invite you to see our Unity detector, a groundbreaking product that redefines traditional analytical methods. By integrating dual Backscatter detectors with dual X-ray elemental detectors into a single probe, Unity stands poised to revolutionize your analytical processes. Join us for a workshop at the ZEISS facility on Tuesday, November 19, and/or register for a demo during one of the time slots listed below.

Add the Revolutionary Unity BEX detector to your microscope starting at $60,000 installed

(Additional promotional pricing available for those who attend a workshop session.)

Register Here

Speakers and Agenda:

Tuesday, November 19, 2024

9:00 a.m. Coffee and Networking

9:30 a.m. Overview

9:45 a.m. Shannon Bollin (ZEISS)
Title: Using Artificial Intelligence for Improved Materials Characterization

10:15 a.m. David Richards (Oxford Instruments)
Title: Pushing the Boundaries of Industrial Microanalysis in SEM with the BEX Technique

10:45 a.m. Lab demonstrations

12:00 Lunch break

1:00 p.m. Optional facility tour


    Exclusive Live Demonstrations: November 19 – 21, 2024 at the ZEISS Industrial Quality Solutions:

    Bring your own sample and sign up for a live demonstration where you will:

    • Gain comprehensive insights into Unity’s capabilities through hands-on demonstrations.
    • Receive expert guidance from our product specialists, ready to address all your inquiries and optimize your usage of Unity.

    Live Hands-on Demonstration Schedule:

    Tuesday, November 19 Wednesday, November 20 Thursday, November 21
    1:00 - 2:30 p.m. 9:00 - 10:30 a.m. 9:00 - 10:30 a.m.
    2:30 - 4:00 p.m. 10:30 a.m. - 12:00 p.m 10:30 a.m. - 12:00 p.m
    4:00 - 5:30 p.m. 1:00 - 2:30 p.m. 1:00 - 2:30 p.m.
    2:30 - 4:00 p.m. 2:30 - 4:00 p.m.
    4:00 - 5:30 p.m. 4:00 - 5:30 p.m.

    About the workshop:

    Why Unity is Essential for Your Success ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution.
    Enhanced Throughput: Experience an unprecedented increase in speed, up to 100 times faster, with Unity’s simultaneous Backscatter and Elemental mapping capabilities. The BEX detector ensures seamless operation. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics.
    Navigate with Chemistry: The fast throughput allows for high frame rate EDS maps so you can survey your sample by chemistry. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility.
    Cartography: Create large area maps in a simple streamlined manner. Now complete "overnight runs" in the time it takes to grab a coffee.  Take sub-nanometer images below 1 kV without an immersion lens.
    Complete data: Unity's unique design eliminates shadowing and lets you analyze a rough sample in one step.   Perform high-resolution imaging and analytics rapidly: switch seamlessly from low current-low kV work to high current-high kV work, and back again utilizing the Gemini 2 column.
    Register Here

    Location

    ZEISS Industrial Quality Solutions 29295 Lyon Oaks Dr, Wixom, MI

    Date

    November 19 – 21, 2024

    Business

    NanoAnalysis