We are excited to invite you to see our Unity detector, a groundbreaking product that redefines traditional analytical methods. By integrating dual Backscatter detectors with dual X-ray elemental detectors into a single probe, Unity stands poised to revolutionize your analytical processes. Join us for a workshop at the ZEISS facility on Tuesday, November 19, and/or register for a demo during one of the time slots listed below.
Add the Revolutionary Unity BEX detector to your microscope starting at $60,000 installed.
(Additional promotional pricing available for those who attend a workshop session.)
Register Here
Speakers and Agenda:
Tuesday, November 19, 2024
9:00 a.m. Coffee and Networking
9:30 a.m. Overview
9:45 a.m. Shannon Bollin (ZEISS)
Title: Using Artificial Intelligence for Improved Materials Characterization
10:15 a.m. David Richards (Oxford Instruments)
Title: Pushing the Boundaries of Industrial Microanalysis in SEM with the BEX Technique
10:45 a.m. Lab demonstrations
12:00 Lunch break
1:00 p.m. Optional facility tour
Exclusive Live Demonstrations: November 19 – 21, 2024 at the ZEISS Industrial Quality Solutions:
Bring your own sample and sign up for a live demonstration where you will:
- Gain comprehensive insights into Unity’s capabilities through hands-on demonstrations.
- Receive expert guidance from our product specialists, ready to address all your inquiries and optimize your usage of Unity.
Live Hands-on Demonstration Schedule:
Tuesday, November 19 |
Wednesday, November 20 |
Thursday, November 21 |
1:00 - 2:30 p.m. |
9:00 - 10:30 a.m. |
9:00 - 10:30 a.m. |
2:30 - 4:00 p.m. |
10:30 a.m. - 12:00 p.m |
10:30 a.m. - 12:00 p.m |
4:00 - 5:30 p.m. |
1:00 - 2:30 p.m. |
1:00 - 2:30 p.m. |
|
2:30 - 4:00 p.m. |
2:30 - 4:00 p.m. |
|
4:00 - 5:30 p.m. |
4:00 - 5:30 p.m. |
About the workshop:
Why Unity is Essential for Your Success |
ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. |
Enhanced Throughput: Experience an unprecedented increase in speed, up to 100 times faster, with Unity’s simultaneous Backscatter and Elemental mapping capabilities. The BEX detector ensures seamless operation. |
These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. |
Navigate with Chemistry: The fast throughput allows for high frame rate EDS maps so you can survey your sample by chemistry. |
Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. |
Cartography: Create large area maps in a simple streamlined manner. Now complete "overnight runs" in the time it takes to grab a coffee. |
Take sub-nanometer images below 1 kV without an immersion lens. |
Complete data: Unity's unique design eliminates shadowing and lets you analyze a rough sample in one step. |
Perform high-resolution imaging and analytics rapidly: switch seamlessly from low current-low kV work to high current-high kV work, and back again utilizing the Gemini 2 column. |
Register Here