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Part of the Oxford Instruments Group
Work alongside Asylum Research applications scientists in a hands-on introductory Atomic Force Microscopy (AFM) course. This two-day class is aimed at those who are new to AFM or who would like to sharpen their fundamental AFM skills. Through a combination of lectures and hands-on experiments students will learn how to perform the key electrical measurements at the nanoscale using the latest Asylum Research AFMs.
Course material will include introduction to the working principles of AFM surface potential, electrostatic force, magnetic force, conductivity, piezoresponse, and scanning capacitance using industry-standard techniques, key probe selection, measurement optimization & artifacts, and basic image modification & analysis. Additionally, the course will survey key applications utilizing these techniques. Attendees may choose to add an additional day to their course experience, during which they will work directly with Asylum applications scientists to image samples from their own labs or receive advanced training. Students will receive a certificate of completion at the end of the course.
Who Should Attend?
Researchers and academic or industrial users of all skill groups and already familiar with tapping mode and contact mode topographical imaging.
If you are a novice to AFM, we strongly recommend you first enroll in one of our Introduction to AFM courses (Santa Barbara or Concord) on topographical imaging to get the most out of this course.
Pricing
$2,600 per attendee for the two-day course. An optional third day of individualized 1:1 training can be included for an additional $1,950.
Course is limited to a maximum of 6 registrants.
Optional 1:1 training add-on is subject to limited availability.
Register NowLocation |
Concord, Massachusetts, USA |
Date |
November 13–14, 2024 |
Business |
Asylum Research |
Travel and Lodging |
For directions and hotel information click here. |
Questions? Contact AFM.Support@oxinst.com. |
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Course Schedule
Day 1
AC/Tapping Mode-based Techniques
Understanding the principles and operation of measuring:
Day 2
Contact Mode-based Techniques
Understanding the principles and operation of measuring:
Day 3 (Optional Add-On)
Image a sample from your own lab or receive individualized advanced training about a topic of your choosing!
Equipment
The course will use the following Asylum AFMs:
Payment
Registrants may choose to pay with credit card or purchase order. Please indicate your preference on the registration form and we will follow up with further details.
Questions
For questions related to this course please contact AFM.Support@oxinst.com.
Course and Travel Information
Attendees are responsible for all travel, hotel, and meal costs, except lunch, which will be included daily and one group dinner on the first night. Your seat for the course will be confirmed after the registration deadline (October 18, 2024). The minimum number of participants is 6, if there are fewer, then the course will be cancelled and any paid registrants will have the option to register in a future course or be fully refunded. Attendees are therefore advised to avoid making non-refundable travel arrangements before the course is confirmed.
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