Julien Lopez, Asylum Research, will be presenting the poster "Quantitative measurements of electromechanical response with interferometric atomic force microscopy" in the "Scanning Probe Frontiers in Molecular 2D-Architecture World" Session at EMRS. Be sure to join us.
Products
DEPOSITION TOOLSPlasma Enhanced Chemical Vapour Deposition (PECVD)Inductively Coupled Plasma Chemical Vapour Deposition (ICPCVD)Atomic Layer Deposition (ALD)Ion Beam Deposition (IBD)ETCH TOOLSInductively Coupled Plasma Etching (ICP RIE)Reactive Ion Etching (RIE)Deep Silicon Etching (DSiE)Atomic Layer Etching (ALE)Ion Beam Etching (IBE)
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