The next SEMT meeting will be held on the 13th December 2023 at the Natural History Museum.
The Society of Electron Microscope Technology meeting is a forum for ideas on techniques and applications in microscopy. It has become one of the foremost user groups in the country, addressing all aspects of microscopy from instrument design and specimen preparation to digital image acquisition.
Oxford Instruments NanoAnalysis will be exhibiting its latest SEM product innovations at the exhibition. Stop by our stand and have a chat with our experts!
Oxford Instruments Electron Microscopy products enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.
We will be introducing Unity - the world’s first BEX imaging detector that combines Backscattered Electron and X-ray (BEX) imaging in a single technique, simultaneously.
Supported by our AZtec software platform, our EDS detectors give you accurate compositional analysis in real time, while our WDS quantifies minor and trace elements with unmatched speed and flexibility.
For microstructural detail, the Symmetry S3 EBSD detectors give unrivalled acquisition speeds, pattern resolution and sensitivity. The resulting certainty allows you to innovate with confidence and redefine the Art of the Possible.
Register now