High Speed atomic force microscopy (HS-AFM) is a segment of AFM imaging that utilizes  a high speed scanner to observe dynamic changes on a surface bound material at acquisition rates of > 30 frames per second. ​

The Duke SMIF core user facility at the Pratt School of Engineering has upgraded their Cypher ES AFM to include this video rate scanning capability of the Cypher VRS AFM. ​

This workshop will offer some examples of the work that can be done using this high performance AFM from Asylum Research, as well offer a hands-on demonstration of the tool, and information on how to get started becoming a patron of the Duke SMIF multi user facility. ​

Register for our workshop HERE.