Analytics for Electron Microscopes
Come and see our Electron
Microscopy products, which enable you to accurately analyse and characterise
materials down to the nanoscale level more rapidly.
We are launching Oi View at Analytica. This groundbreaking new
digital platform which delivers real-time insights on your Oxford Instruments SEM
systems to your phone, tablet or PC, allowing you to stay informed, wherever
you are.
We are introducing Unity - the world’s first BEX imaging
detector that combines Backscattered Electron and X-ray (BEX) imaging in a single technique,
simultaneously. Supported by our AZtec software platform, our EDS detectors give
you accurate compositional analysis in real time, while our WDS quantifies
minor and trace elements with unmatched speed and flexibility. For
microstructural detail, the Symmetry S3 EBSD detector give unrivalled
acquisition speeds, pattern resolution and sensitivity.
We are running virtual demos of all our systems from the stand. Request a demo, now.
Book a virtual demo at Analytica 2024