We are excited to invite you to the University of Chicago’s Materials Research Center featuring Atomic Force Microscopy, Nanoindentation, Electron Microscopy and Raman Microscopy. Come join us on April 15, 2025 for a day of theory and applications, and/or stay for your hands-on workshop with application specialists by registering with your sample.
- Explore the Unity detector, a groundbreaking product that redefines traditional analytical methods. By integrating dual Backscatter detectors with dual X-ray elemental detectors into a single probe, Unity stands poised to revolutionize your analytical processes.
- Try out the latest in Confocal Raman Microscopy to see how we achieve the highest speed, sensitivity and resolution – without compromise. Their modular design provides the flexibility to configure each system for the individual requirements and to adapt to future challenges.
- Discover the highest resolution and unmatched speed for Atomic Force Microscopy. With a multitude of stage accessories available, samples can range from atomic level defect, 2D Moire patterns, magnetic or electric, hard or soft, trench measurements, stress by stretching, or temperature control.
Register Here
Speakers and Agenda
Tuesday, April 15, 2025
8:30 a.m. Coffee and Networking
9:00 a.m. Welcome and Overview
9:05 a.m. Ted Limpoco (Oxford Instruments)
Title: AFM
9:50 a.m Speaker (University of Chicago)
Title: TBD
10:00 a.m Speaker (University of Chicago)
Title: TBD
10:10 a.m Speaker (University of Chicago)
Title: TND
10:30 a.m. FemtoTools (Oxford Instruments)
Title: Nanoindentation
11:15 a.m. Wei Liu (Oxford Instruments)
Title: Raman
12:00 Lunch break
1:00 p.m. David Richards (Oxford Instruments)
Title: Electron Microscopy
1:45 p.m. Speaker (University of Chicago)
Title: TBD
1:55 p.m. Speaker (University of Chicago)
Title: TBD
2:05 p.m. Speaker (University of Chicago)
Title: TBD
2:30 p.m. Facility Tour
3:00 p.m. Lab demonstrations
4:50 p.m. Thanks and Prize
About the workshop
Exclusive Live 1-hour Workshops: April 16-17, 2025 at the MPML:
Bring your own sample and sign up for a live demonstration where you will:
- Experience the capabilities through hands-on demonstrations.
- Receive expert guidance from our product specialists.
Why Unity |
Why Cypher |
Why alpha300 |
Enhanced Throughput: Experience an unprecedented increase in speed, up to 100 times faster, with Unity’s simultaneous Backscatter and Elemental mapping capabilities. The BEX detector ensures seamless operation. |
Easy Operation: SpotOn™ makes the fully motorized laser and detector alignment one-clickGetReal™ automatically calibrates the cantilever spring constant and sensitivityblueDrive™ makes tapping mode simpler, more stable, and more quantitative |
Laser Control: Know the exact power of the laser being delivered to your sample with TruePower real-time laser power determination to less than 0.1 mW accuracy. Preserve delicate samples and reproduce exact measurement conditions. |
Navigate with Chemistry: The fast throughput allows for high frame rate EDS maps so you can survey your sample by chemistry. |
Results in Seconds: Using a smaller spot size allows for smaller probes and faster scanning speeds from 10x to 100x faster than traditional AFM’s. |
Coupler Concept: See the couplers tower over the microscope to expand the flexibility and versatility of the alpha300. |
Cartography: Create large area maps in a simple streamlined manner. Now complete "overnight runs" in the time it takes to grab a coffee. |
Resolution: With a noise floor that is half of other AFM’s the Cypher has unmatched mechanical stability and exceptionally low drift. |
Seek and Find: ParticleScout automates the Raman analysis of particles and TrueMatch identifies the chemical compounds. |
Complete data: Unity's unique design eliminates shadowing and lets you analyze a rough sample in one step. |
Small Footprint, Hugh Potential: no additional hood or vibration isolation necessary to expand this AFM with environmental controls, to video-rate imaging speeds, and high voltages. |
Have It All: Delivering advanced chemical characterization with industry-leading speed, sensitivity and resolution – simultaneously. |