Mar
25

What can I measure with an Atomic Force Microscope? Lunch & Learn Event

We are pleased to invite you to our upcoming Lunch & Learn hosted by Oxford Instruments Asylum Research in conjunction with Dr. Tobin Filleter and NanoM2 at the University of Toronto. We will explore 2D materials applications with Atomic Force Microscopy to characterize correlative properties with topography.

We will also offer live imaging sessions in the lab to see the Cypher S with BlueDrive photothermal cantilever drive in action before / after the presentations.

This workshop has hit capacity. For more info, please reach out to lisa.mcdonald@oxinst.com

Agenda

11:00 – 11:45 – “Advanced Materials characterization Modes” – Dr. Ted Limpoco, Applications Scientist, Oxford Instruments Asylum Research

11:50 am – 12:10 pm - “Probing the Atomic Flatlands” – Akibul Islam, University of Toronto

12:15 pm - 12:30 PM - Lunch will be provided on-site

12 :35- 12:55 - “Nanomechanical characterization of 2D materials via AFM” - Boran Kumral, University of Toronto

1:00 – 1:20 - "AFM-based friction and wear characterization of 2D materials" - Nima Barri, University of Toronto

Location

University of Toronto

Date

March 25, 2025

Business

Asylum Research

Graphene and 2d materials
https://afm.oxinst.com/products/cypher-afm-systems/cypher-s-afm-microscope