The AFM&SPM 2024 meeting will take place at Durham University.
AFM&SPM is an international conference on scanning probe microscopies, organised annually in conjunction with the Royal Microscopy Society.
Come and discover with our experts our AFM solutions:
Our Cypher family of AFMs are designed for ultimate resolution and fast scanning, with specialized models for video-rate nanoscale dynamics and fully integrated environmental control. The Jupiter XR large sample AFM infuses high performance technology into a large sample system, providing unprecedented resolution, speed, and reproducibility for R&D and user facility labs. The MFP-3D Origin AFMs are robust systems, and span a range of performance, accessories, and pricing. We also offer a comprehensive selection of AFM probes, accessories, samples, and tools.
Discover Vero, our latest next-generation AFM, which builds on the incredible performance of the Cypher platform but incorporates interferometric detection (a quadrature phase differential interferometer – QPDI) to measure true vertical tip displacement. This eliminates common artifacts that arise in AFMs using the optical beam detection (OBD) method of measuring cantilever angle. Vero’s QPDI detection system avoids crosstalk between vertical and in-plane tip forces and has a noise floor significantly lower than OBD systems for higher measurement sensitivity. The technological advances in Vero enable AFM measurements to be made with unrivalled accuracy and repeatability.
Meet our team and discuss your current work and process challenges with our experts!
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