The Advanced Material Show

The Advanced Materials Show provided a truly unique exhibition and conference that brought together a highly focused audience, all involved in the research, production, purchasing or integration of advanced materials technology including Graphene & 2D Materials, Composites, Polymers, Coatings, and Ceramics.

Oxford Instruments attended to present its latest product innovations. 

Oxford Instruments materials analysis solutions enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.

Our innovative expertise and key-enabling technologies will empower you to accelerate your R&D or increase your productivity.

Featured Technologies included:

• Oxford Instruments NanoScience designs, supplies and supports market-leading research tools that enable quantum technologies, new materials and device development in the physical sciences. Our tools support research down to the atomic scale through creation of high performance, cryogen-free low temperature and magnetic environments, based upon our core technologies in low and ultra-low temperatures, high magnetic fields and system integration, with ever-increasing levels of experimental and measurement readiness.
  
• NanoAnalysis tools enabling materials characterisation (including EDS, EBSD and WDS) and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of applications including coatings, semiconductors, renewable energy, mining, metallurgy, and forensics.
• NMR spectroscopy and time domain (TD-NMR) relaxometry. The X-Pulse NMR spectrometers and MQC+ analysers provide fast, simple and accurate measurements to deliver robust solutions for industries including batteries, construction materials, textiles, polymers, chemicals.
• Atomic Force Microscopy (AFM) for academic research and industrial R&D, enabling cutting-edge work in fields including, 2D materials, polymer science, semiconductors.
• Confocal Raman imaging microscopes for 2D and 3D chemical characterization. WITec Raman microscopes can also be integrated with AFM, SEM, SNOM or Raman-based particle analysis as correlative systems for investigating chemical and structural sample properties.