The Microscopy Society of Ireland’s (MSI) Annual Symposium will be hosted by Tyndall National Institute, University College Cork from the 18th to the 20th of January.

The symposium will bring together researchers from around the world for discussions on various microscopy themes such as advances in image analysis, solid-state physics, nanomedicine, as well as materials and biological microscopy applications.

Oxford Instruments will be exhibiting its latest SEM and atomic force microscope (AFM) product innovations at the exhibition. Stop by our booth and have a chat with our experts!

Oxford Instruments Electron Microscopy products enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.

Supported by our AZtec software platform, our EDS detectors give you accurate compositional analysis in real time, while our WDS quantifies minor and trace elements with unmatched speed and flexibility.

For microstructural detail, the new Symmetry S3 detectors give unrivalled acquisition speeds, pattern resolution and sensitivity. The resulting certainty allows you to innovate with confidence and redefine the Art of the Possible.

The Cypher AFM, routinely achieves higher resolution than other AFMs and is available with a full range of operating modes, environmental controls, and even video-rate scanning.