2024 MRS Fall Meeting & Exhibit - Oxford Instruments

Oxford Instruments will be showcasing our cutting-edge technologies. This includes our next-generation Atomic Force Microscopy (AFM), confocal Raman microscopy, electron microscopy detectors, and nanoindentation technology. We are proud to unveil exciting developments that are currently in the pipeline and offer live demonstrations of our latest innovations. Visit our booth to experience firsthand the advancements we are making in these fields.

Discover our latest innovation in nanomechanical testing, capable of accurately quantifying the mechanical and tribological properties at the micro- and nanoscale.

Learn more about Nanoindentation

Vero S is the standard ambient configuration of the next-generation Vero AFMs, which precisely and accurately measure true tip displacement using Quadrature Phase Differential Interferometry (QPDI).

Learn more about the Vero S

Ultim® Max ∞ SDD detectors unlock the infinite potential of EDS for characterizing materials in the SEM. They combine unparalleled accuracy, sensitivity and speed to power AZtec Live software to solve the most complex or difficult analysis challenges.

Learn more about Ultim Max Infinity

The alpha300 Semiconductor Edition provides large-area wafer inspection for the semiconductor industry

Learn more about the alpha300

Join Oxford Instruments for two speaking sessions at the highly anticipated Material Research Society meeting. Chief Technology Officier, Roger Proksch, and R&D Scientist Joel Lefever will discuss advances in AFM technology using quadrature phase differential interferometery (QPDI).

High-Speed Lattice Resolution and Friction Loops on 2D Materials Using a New Interferometric Atomic Force Microscope

Speaker: Joel Lefever

Session: NM01.03.06 Nanotubes, Graphene and Related Nanostructures: Structure and Properties I

When: 12/3, 11:00 – 11:15 am

Where: Hynes, Level 2, Room 200

Joel will discuss the benefits of using QPDI to optimize analysis of tribological and electrical properties of 2D materials. QDPI enables extremely low noise floor and highly accurate positional measurements for lateral force microscopy at high scan rates.

Accurate Mapping of Three-Dimensional Nanomechanics in Polymers and Soft Materials Using Interferometric Atomic Force Microscopy

Speaker: Roger Proksch

Session: CH03.04.01 Towards Quantitative Characterization of Soft Materials by Scanning Probe Microscopy – Beyond Imaging: Polymers and Soft Materials II

When: 12/5, 8:15 – 8:45 am

Where: Sheraton, Third Floor, Tremont

Roger will demonstrate how new workflows for soft material imaging and characterization can be enabled using QPDI technology. Examples will include frequency-dependent rheological and high resolution tapping measurements.