RISE Microscopy
RISE instruments seamlessly integrate confocal Raman imaging and scanning electron microscopy (SEM). They incorporate the sensitivity and non-destructive nature of Raman spectroscopy with the atomic resolution of electron microscopy.
Raman imaging enables the identification of molecules, their allotropes and polymorphs, the determination of their orientation, purity and crystallinity, and the detection of strain states. SEM allows for the imaging of surface structures on the nanometer scale.
EDS Microscopy
EDS (Energy Dispersive X-ray Spectroscopy) is a technique for elemental and compositional analysis based on the detection and analysis of X-rays produced by electron irradiation of a sample. Ionisation causes an inner-shell electron of constituent atoms to be ejected. This creates a vacancy in the electron orbital.
An electron from an outer shell, with a higher energy level, transfers to the inner shell to stabilise it, and an X-ray is emitted during this process. This so-called characteristic X-ray has a specific energy value for each element. From such signals, it is possible to determine microstructure, composition and crystal structure.