Application

Material Composition and Structure

Understanding the chemistry and structure of materials is key to understanding their behaviour

Metals alloys and ceramics have a place in almost all of global manufacturing. Whether it is the turbine blades in a jet engine, the ceramic brake pads on a sports car or the steel cables for a suspension bridge, understanding the composition and structure of these materials is critical in understanding their properties. Using electron microscopy it is possible to characterise both these properties. Understanding the distribution and composition of nanoscale precipitates in Ni-based superalloys is crucial to understanding their performance under extreme temperatures. Using energy dispersive x-ray spectrometry (EDS) in the transmission electron microscope (TEM) allows ultra high-resolution analysis of these materials to determine the chemistry of these precipitates. Our X-MaxN 100TLE EDS detector is the perfect solution for this; the high sensitivity allows analysis to be performed quickly and accurately whilst remaining sensitive to trace elements that may arise from contamination during the manufacturing process.

Material Composition and Structure figure 2

In the scanning electron microscope (SEM), electron backscatter diffraction can be used to characterise structural properties such as grain size and orientation as well as stresses and strains within the material. Our Symmetry EBSD detector is the perfect solution for any materials challenge, as the world’s first CMOS based EBSD camera it combines speed and sensitivity to acquire accurate results quickly.

This speed and sensitivity are enabling high-speed characterisation of large 3D volumes using slice and view techniques in the focused ion beam (FIB) ensuring that the material structure and composition is understood not just in isolation but in the context of the surrounding material.

Material Composition and Structure figure 3

For larger volumes still, x-ray computed tomography is the most widely used technique, these systems require high-performance x-ray sources and detectors to ensure the highest quality data is collected. Our x-ray sources are used in tools to verify chemical composition of bulk materials by x-ray fluorence in primary and secondary (recycle) markets, as well as in x-ray diffractometers for precise crystallographic analysis. X-ray imaging techniques of absorption or scattering are the basis of measuring thicknesses and defects in advanced composite and metal structures.

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Products

The 1501 Series X-ray tube is a 50kV, 50-75W X-ray tube designed for applications where high current, high flux density and continuous operation are important. Utilizing our highly…

Material Composition and Structure

Products

1501 Series Glass X-ray Tube

Solis S

iDus 416 CCD

iKon-L 936 CCD

1500 Series Glass X-ray Tube

Newton 971 EMCCD

iDus 2.2µm InGaAs

Shasta Series X-ray Tube Power Supply

Cypher ES Polymer Edition AFM

Newton 920 CCD

Jupiter XR AFM

Shamrock 500i Spectrograph

Jupiter 5000 Series Radiation Shielded X-ray Tube

Mechelle 5000 Spectrograph

OmniProbe 400

Solis I

3000 Series 30kV X-ray Tube

Apogee 5500 Series Radiation Shielded X-ray Tube

Newton 970 EMCCD

iKon-XL SO CCD

Newton SY CCD

Shamrock 750 Spectrograph

Cypher L AFM

iKon-M SY CCD

Cypher ES Environmental AFM

Newton SO CCD

MFP-3D Origin+ AFM

iDus 401 CCD

iKon-M SO CCD

Solis T

1550 Series Glass X-ray Tube

iKon-L HF CCD

MFP-3D Origin AFM

iStar sCMOS

iKon-L SY CCD

OmniProbe 350

iDus 420 CCD

MFP-3D-BIO AFM

Zyla-HF sCMOS

Cypher S AFM Microscope

Newton 940 CCD

Cypher VRS1250 Video-Rate High Speed AFM

X-Pulse Spectrometer

iKon-L SO CCD

iStar 320T CCD

Kymera 328i Spectrograph

iStar 340T CCD

Software Development Kit

iDus 1.7µm InGaAs

Kymera 193i Spectrograph

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