New X-MET5000 a robust analyzer for fast verification of critical materials

Oxford Instruments announces the launch of a new, rugged X-Ray Fluorescence (XRF) analyzer – the X-MET5000, for the accurate and reliable identification of metal alloys. The X-MET5000 represents the 4th generation of Oxford Instruments’ hand-held analyzers. 

This design experience combined with Oxford Instruments’ patented PentaFET® detector technology guarantees fast analysis and lower detection limits for all elements of interest.

This versatile tool will be appreciated by inspection companies that provide a wide range of screening such as Positive Material Identification (PMI), flow accelerated corrosion testing, RoHS screening or even soil analysis. 

This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash water protection.  The X-MET5000 is perfect for the harshest environments. The battery’s operating time of one working day is unique and enables extended productivity. 

An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.