Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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Plasmalab®µEtchEL entry-level dual-mode RIE/PE etch tool for failure analysis

Dry plasma etch de-processed structure after IMD removal for failure analysis

Plasmalab®µEtchEL Entry-Level Dual-Mode RIE/PE Etch Tool for Failure Analysis

The PlasmalabµEtchEL is a flexible and economic tool that offers a range of processes for failure analysis from isotropic passivation removal to anisotropic oxide removal, from small die or packaged devices through to 200 mm wafers.

Failure Analysis Process Applications

  • Isotropic polyimide removal (RIE mode)
  • Isotropic SiNx removal (PE mode)
  • Anisotropic IMD/ILD etch (RIE mode), including low-k oxide
  • Decoration/delineation (cross section to prepare for SEM)

Unique Process Performance Benefits

  • Outstanding uniformity over 200 mm wafers
  • Clean removal of polyimide, nitride and oxide
  • Excellent run to run reproducibility
  • High selectivity to underlayer material

Key System Features

  • Dual-mode RIE/PE
  • RF generator (300 W, 13.56 MHz)
  • System pumped by RSV33/301BF Rootes rotary
  • 4 gas lines (CF4, CHF3, O2, Ar)
  • Automatic pressure control
  • Capacitance manometer (1 Torr)

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